FISCHER XAN 215

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FISCHER XAN 215

XAN 215 FISCHER Common Process for Testing Cost-effective entry-level X-Ray Fluorescence Measuring Instrument for fast and non-destructive Analysis and Coating Thickness Measurement of Gold and Silver Alloys The FISCHERSCOPE X-RAY XAN 215 is the cost-effective entry-level X-ra...

XAN 215 FISCHER

Common Process for Testing

Cost-effective entry-level X-Ray Fluorescence Measuring Instrument for fast and non-destructive Analysis and Coating Thickness Measurement of Gold and Silver Alloys

The FISCHERSCOPE X-RAY XAN 215 is the cost-effective entry-level X-ray fluorescence measuring instrument for non-destructive analysis of jewelry, coins and precious metals.

It is particularly suited for the analysis of precious metals and their alloys in composition and coating thickness. Up to 24 elements in the range of Chlorine (17) to Uranium (92) can be determined simultaneously.

Typical fields of application are the analysis of:
• Jewelry, precious metals and dental alloys
• Yellow and white gold
• Platinum and silver
• Rhodium
• Alloys and coatings
• Multi layer coatings

Outstanding accuracy and long-term stability are characteristics of all FISCHERSCOPE X-RAY systems. The necessity of recalibration is dramatically reduced, saving time and effort.

The modern silicon PIN detector achieves high accuracy and good detection sensitivity.

The fundamental parameter method by FISCHER allows for the analysis of solid and liquid specimens as well as coating systems without calibration.

Features:

  • Excellent precision in analysis and coating thickness measurement
  • Reduces the requirements of recalibration thus saving time and effort
  • Equipped with PIN detector for high accuracy
  • Optimum detection sensitivity

Application Areas:

  • Jewellery, dental alloys and precious metals
  • Platinum and silver
  • Rhodium
  • Yellow and white gold
  • Multi layer coatings
  • Alloys and coatings

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