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FISCHER XAN 250

XAN 250 FISCHER Common Process for Testing DETAILS: Universal high performance X-r..

XAN 250 FISCHER

Common Process for Testing

DETAILS:

Universal high performance X-ray fluorescence (XRF) measuring instrument for fast and non-destructive material analysis and coating thickness measurement

FEATURES

  • Universal premium instrument with comprehensive measurement capabilities
  • Aperture (collimator) 4x electrically changeable, Primary filter 6x electrically changeable
  • With high-resolution silicon drift detector (SDD) also applicable for more complex analyses with many elements
  • Measuring direction from bottom to top, this allows for quick and easy sample positioning

TYPICAL FIELDS OF APPLICATION

  • Measurement of functional coatings, starting from a few nanometers, in the electronics and semiconductor industries
  • Trace analysis for consumer protection, e.g. lead content in toys
  • Analysis of alloys with highest requirements of accuracy in the jewelry and watch industries and in metal refineries
  • Research in universities and in the industries