XAN 250 FISCHER

DETAILS:

Universal high performance X-ray fluorescence (XRF) measuring instrument for fast and non-destructive material analysis and coating thickness measurement

FEATURES

• Universal premium instrument with comprehensive measurement capabilities
• Aperture (collimator) 4x electrically changeable, Primary filter 6x electrically changeable
• With high-resolution silicon drift detector (SDD) also applicable for more complex analyses with many elements
• Measuring direction from bottom to top, this allows for quick and easy sample positioning

TYPICAL FIELDS OF APPLICATION

• Measurement of functional coatings, starting from a few nanometers, in the electronics and semiconductor industries
• Trace analysis for consumer protection, e.g. lead content in toys
• Analysis of alloys with highest requirements of accuracy in the jewelry and watch industries and in metal refineries
• Research in universities and in the industries